Ovality measurement  Manufacturers, Traders, Suppliers

For more than 20 years Lamtech Lasermesstechnik develops and produces interferometers for the from testing of parts, as well as evaluation software and customized opto-mechanical systems.
The emphasise lies on interferometers for the non-contact flatness check of technical precision surfaces. The interferometers are placed within production lines, measuring rooms as well as the 100% control.
Due to the in-house research and development, Lamtech Lasermesstechnik can easily adapt towards customer-specific measurement requirements.

LAP,
your global partner for alignment, positioning and non-contact measurement
using state-of-the-art laser technology.
LAP develops, produces and distributes line lasers, laser projectors,
laser sensors and systems for dimensional measurement.
For more than 20 years, LAP has been developing, manufacturing and distributing Laser Measurement Systems, Line Lasers and Laser Template Projectors for industrial and medical applications.
Using our Laser systems our customers improve performance and increase the quality of their products as well as the effectiveness of their processes. To achieve this goal, we offer customer specific solutions or standard systems.
As a result of continuous product innovation, LAP has become a world leader in lasers for projection and measurement. LAP products are setting the standards in a wide range of markets from manufacturing to heavy industrial environments and medical applications.

FRT is one of the world's leading suppliers of 3D metrology for R&D and mass production. The FRT MicroProf® is established in the semiconductor front-end, advanced packaging, MEMS, VCSEL, automotive, mechanical engineering, optics, LED and medical markets.
A third-generation ultra-stable platform and proprietary software are the result of more than 25 years of experience. The FRT multisensor concept and hybrid measurement technology support production lines worldwide. The applications are non-contact and fully automatic. Measurement parameters are topography, step height, roughness, TTV, curvature, warpage, tension, layer and stack thickness, overlay and CD - and many more.
Different measuring methods can be combined with point, line and area sensors as well as layer thickness sensors and atomic force microscopes in one measuring device and recipe.
The multi-award-winning measuring systems provide (also fully automatically) information on topography, structure, step height, roughness, wear, layer thickness and many other parameters, non-contact and non-destructive.
Depending on the application, different measuring methods with point, line, area and layer thickness sensors as well as atomic force microscopy can be combined in one measuring device - the measuring ranges can extend from the metre to the sub-nanometre range.