Centering Micrpscope  Manufacturers, Traders, Suppliers

In order to measure XY distances within the workspace of modern CNC processing machines (processing centres, sinker and wire EDM machines, rotation centres, etc.), the small, easy-to-handle USB camera system CV-VZM is the ideal solution. Examine and measure intricate details without having to wire components – particularly useful in limit ranges. The USB 2.0 camera with 1600 x 1200 pixels offers excellent image quality. The double lens has a working distance of approx. 35 mm. The viewing field spans approx. 3 mm horizontally, and enables optical magnification of approx. x70 onto a 17” screen diagonal. The viewing fields and magnification or working distances can be adjusted using a range of tubes and lenses. The aluminium support (anodized) can be delivered with a thread for a steep taper or Morse taper insert if requested. Special versions with closed casing are also available upon request. The camera system is used in connection with the Metric BE (localiser crosshair display only). Distance measurements can now be carried out using the machine’s measuring systems. In combination with the Metric Standard or Metric Plus software, measurements such as distance, angle, radius and surface area are also possible within the viewing field. Connection to Excel also ensures quick and easy logging of images and measuring values. Special functions, such as the DXF overlay module, make controlling the device even easier. The parts are illuminated through a ring light with 9 LEDs arranged at an angle of 30º. The LED ring light is supplied with electricity via the camera. For extremely reflective surfaces, the CV-VZM systems can also be delivered with coaxial lighting.

XY measurements in a machining centre using a USB video microscope is an elegant and time-saving way of checking parts for dimensional accuracy without the need for clamping. For example, in the production of rotary punching cylinders (milling machines), checking the cutting lines (mirrors) is of great interest in addition to the normal XY measurements.